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Product category: Recruitment, Reports and Resources
News Release from: National Physical Laboratory
Edited by the Electronicstalk Editorial Team on 08 April 2005
New technique to assess whisker growth
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A new report that highlights the progress made in a project aimed at formulating a practical test method for measuring the internal stresses in the coatings of electronic components.
The National Physical Laboratory has launched a report that highlights the progress made in Phase 2 of a studio project aimed at formulating a practical test method for measuring the internal stresses in the coatings of electronic components, based on the XRD technique The work is driven by the necessity to be able to assess the potential of whisker growth