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Product category: Stand-Alone Instruments
News Release from: National Physical Laboratory | Subject: SAM testing services
Edited by the Electronicstalk Editorial Team on 06 April 2005
Scanning acoustic microscopy spots
reflow damage
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The NPL has developed broad expertise in applying scanning acoustic microscopy for assessing the level of delamination in printed circuit boards and die cracking inside electronic packages.
The National Physical Laboratory has developed a broad expertise in applying scanning acoustic microscopy (SAM) - a nondestructive tool for assessing the level of delamination in printed circuit boards and die cracking inside electronic packages Typical applications include: the assessment of plastic compounds developed for lead-free components that must withstand the more demanding