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News Release from: National Physical Laboratory
Edited by the Electronicstalk Editorial Team on 5 April 2005
Clubs unite to tackle PCB issues
Two of NPL's Metrology Clubs are joining together to organise an interactive workshop on printed circuit boards on Thursday 5th May 2005
Two of NPL's Metrology Clubs are joining together to organise an interactive workshop on printed circuit boards (PCBs), which will be held on Thursday 5th May 2005 at NPL. The two clubs are the EMMA-Club (the Electromagnetic Materials Measurements and Applications Club) and SSTC (the Soldering Science Technology Club).
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The EMMA-Club covers all aspects of dielectric and electromagnetic materials measurements at RF and microwave frequencies; whereas the SSTC is concerned with the soldering processes and reliability of PCB interconnectivity.
The two clubs hope that this interdisciplinary event will be of interest to all professionals who work with PCBs.
The clubs believe that the timing of this workshop is opportune.
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'Test method for conformal coating protection performance of electronic assemblies in harsh environments' by Dr Chris Hunt and L Zou is available now from NPL
Under the pressure of technical progress electronics manufacturers are finding it necessary to use ever-higher packaging densities in their circuits, while faster operation of the applications and higher information transfer rates require ever-faster circuits.
Thus, while automotive electronics formerly worked in the megahertz frequency range, there is a growing requirement to implement circuits operating at gigahertz frequencies.
Higher frequencies require both newer and better performance materials and better measurement methods for characterising and optimising circuits.
These issues will be covered in this workshop along with other topics to be selected from the following: dielectric properties of substrates; moisture take-up in substrates and its effects on circuit performance; loss measurements in PCB substrates - new methodologies; anisotropy in substrates; CAF (conductive anodic filamentation); LTCC test methods; embedded passives; frequency- and time-domain characterisation of circuits and PCBs; standard test methods; effects of solder mask on impedance; and robustness of PCB structures with microvias.
In all these areas the measurement of circuit parameters, their effects on performance and their optimisation will be of interest.
Papers and informal contributions on these and related topics are invited from participants.
It is planned that there will be discussion sessions at the workshop which will investigate ways in which the NPL and the National Measurement System (NMS) can help industry to solve PCB-related measurement and optimisation problems.
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