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Product category: Stand-Alone Instruments
News Release from: Nanotronix | Subject: mTDR070
Edited by the Electronicstalk Editorial Team on 20 May 2003
New approach adds accuracy to cable
fault location
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Nanotronix has developed an ultrafine time measurement technology that can accurately measure length and pinpoint faults in cable networks.
Nanotronix has developed an ultrafine time measurement technology that can accurately measure length and pinpoint faults in cable networks The technique is used in the company's mTDR070 metallic time domain reflectometer
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)