NIWeek to cover graphical system design

National Instruments has announced plans for NIWeek, a graphical system design conference and exhibition that is expected to attract more than 3,000 engineers, educators and scientists.

NIWeek 2009, the company's 15th annual customer and technology conference, will run from 4-6 August at the Austin Convention centre in Austin, Texas.

It will provide technical sessions, hands-on workshops, targeted summits and interactive exhibitions on the latest developments for design, control, automation, manufacturing and test.

The conference will also feature keynote presentations and product demonstrations.

Dr James Truchard, chief executive officer and co-founder of National Instruments, said: 'At NIWeek 2009 we will look at how the versatility of the graphical system design platform gives engineers and scientists a cost-effective way to make dramatic improvements to their applications.' NIWeek 2009 will feature more than 200 technical sessions from companies and universities such as Averna, Harris, Freescale Semiconductor and Purdue University.

These sessions will highlight the latest developments in test and data acquisition, industrial measurements and control, embedded design and software-development techniques.

They will also equip engineers and scientists with the skills they need to remain competitive in development and business practices.

The conference will feature the first ever NIWeek Military and Aerospace Summit, along with technical summits on RF and wireless communications, vision and robotics.

NIWeek will also provide daily keynote presentations from NI executives and research and development staff, including: Dr Truchard; Jeff Kodosky, NI co-founder and business and technology fellow; Mike Santori, NI business and technology fellow; John Graff, NI vice-president of marketing; and Ray Almgren, vice-president of academic relations.

Olin College's David Barrett will deliver a keynote presentation on how robotics in industry and engineering education will revolutionise the way people interact with technology in their daily lives.

Each of the technical summits will feature keynote presentations from industry experts including Ellen Purdy, enterprise director of joint ground robotics for the US Department of Defence, and Dean Kamen, founder of First (For Inspiration and Recognition of Science and Technology).

The exhibition hall will feature the technologies discussed during the keynote presentations and technical summits in areas such as the Labview Zone and the RF and Wireless Pavilion.

The conference will also host networking events such as daily Peer2Peer Roundtables, which provide opportunities for attendees to discuss best practices with their peers and NI developers for a specific application, job position or industry.

In addition to the technical sessions offered during NIWeek, attendees can take advantage of the two-day advanced training sessions offered prior to NIWeek at the Austin Convention Center, from 2-3 August.

These training sessions will help attendees gain in-depth product knowledge and learn best practices for NI Labview and RF applications, among others.

With each course, attendees can earn 1.4 continuing education units to maintain a professional status such as professional engineer.

Attendees can also take certification exams in Labview, NI LabwindowsTM/CVI and NI Teststand software.

The training and certification exams will help advance and validate development skills for engineers and scientists, giving them a competitive edge in the industry.

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