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Product category: Stand-Alone Instruments
News Release from: Moritex Europe | Subject: Semiconductor Inspection System
Edited by the Electronicstalk Editorial Team on 25 March 2004
IR-based system looks to improve IC
reliability
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A novel infra-red-based system provides reliable inspection of semiconductor wafers and devices.
A novel infra-red-based system provides reliable inspection of semiconductor wafers and devices Comprising a high-performance 100W halogen-type light source, fibre-optic light guide, telecentric lens and IR-sensitive camera the new system provides a total solution for accelerating assurance of wafer construction accuracy and quality