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Product category: Design and Development Software
News Release from: Mentor Graphics UK
Edited by the Electronicstalk Editorial Team on 14 July 2006
Award for Design-for-Test Team
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Mentor Graphics Design-for-Test Team Awarded IEEE CEDA Donald Pederson Best Paper Award.
Mentor Graphics Corporation has announced that a team from its Design-for-Test (DFT) Division has been awarded the prestigious 2006 IEEE Circuits and Systems Society Donald Pederson Best Paper Award The award, given for the team's ground-breaking work on Embedded Deterministic Test (EDT), honors the best paper published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
This article was originally published on Electronicstalk on 21 Feb 2001 at 8.00am (UK)