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Luna Technologies' new full-colour brochure details the company's breakthrough optical vector analyser (OVA) technology for fibre-optic component testing.
The brochure explains the time and cost saving benefits of Luna's patented optical characterisation technique that provides robust component qualification, faster test cycles, reduced capital investment, and improved manufacturing productivity.
This patented technology, which gives users detailed information equivalent to the DNA of optical components in next-generation optical networks, is designed to meet both the current demands and future growth of component testing for optical networks.
The brochure details the Luna OVA 1550, which provides simultaneous, rapid, precise and comprehensive measurement of multiple optical component characterisations including: insertion loss, group delay/chromatic dispersion (CD), polarisation mode dispersion (PMD), crosstalk/isolation, and polarisation dependent loss (PDL).
The OVA 1550 performs the complete range of optical components testing over a 40nm range in less than 15s, compared with the typical 20min required by other testing methods.
Using interferometry, the OVA 1550 performs a complete measurement of the Jones matrix of an optical component.
The linear optical parameters are then extracted and interpreted through software to provide the comprehensive component characterisation data.
The brochure outlines the existing research, design and manufacturing applications of Luna's technology, including passive optical components, optical systems requiring high bit rates, and next-generation systems and networks.
The company's product development is targeted for a broad range of component characterisation applications for both R and D and manufacturing.
Additional advantages highlighted in the brochure include the product's ability to provide both phase and amplitude light measurements, higher sensitivity to 72dB, a wider dynamic range up to 60dB, as well as lower noise characteristics and greater resolution to 1.6pm.
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