Product category: Stand-Alone Instruments
News Release from: Keithley Instruments | Subject: Model 4200-SCS Hot Carrier System
Edited by the Electronicstalk Editorial Team on 26 September 2001
Tester seeks out hot carrier induced
faults
Keithley Instruments has a new version of its Model 4200-SCS semiconductor characterisation system that reduces the time required to test for hot carrier induced (HCI) degradation effects.
Keithley Instruments has a new version of its Model 4200-SCS semiconductor characterisation system that reduces the time required to test for hot carrier induced (HCI) degradation effects Keithley's Model 4200-SCS Hot Carrier System is a fully integrated set of hardware and software that eliminates device packaging costs and delays, allowing accurate HCI degradation testing as soon as wafers are produced
This article was originally published on Electronicstalk on 19 Jun 2008 at 8.00am (UK)
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