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Product category: Design and Development Software
News Release from: Kane Computing | Subject: DiaTem Debugger
Edited by the Electronicstalk Editorial Team on 16 April 2007

Debugger boosts JTAG emulator performance

Note: A free brochure or catalogue is available from Kane Computing on the products in this news release. Click here to request a copy.

Boundary scan software package that supports and enhances the capabilities of the Spectrum Digital XDS510USB Plus JTAG emulator

Kane Computing, the UK distributor for Spectrum Digital, has a new boundary scan software package that supports and enhances the capabilities of the Spectrum Digital XDS510USB Plus JTAG emulator. The new DiaTem debugger software has been created by Temento Systems, a leading supplier of boundary scan test software.

Using the XDS510USB Plus JTAG emulator and the DiaTem Debugger, the designer can now test the most critical portions of their target board that are connected via boundary scan logic.

This strongly decreases the number of variables in the debug activity, allowing to converge more rapidly in an efficient debug phase.

To achieve this, the new XDS510USB Plus JTAG emulator, with configurable EMU0/1 pins, provides the link between the DiaTem Debugger running on the host PC and the DSP on the target board.

The DiaTem Debugger can be used to initially bring up the target board efficiently and rapidly.

The DiaTem Debugger software allows the designer to describe his board in a few clicks and apply all automatic test pattern generators (ATPG) for JTAG devices and clusters for non-JTAG devices.

This allows the detection and diagnosis of the most frequent board failures to ensure that the processor can reach all the memories and peripherals prior to loading any functional test code on the board.

The database of the board is automatically generated by DiaTem Debugger and is usable by other DiaTem stations to develop more tests; custom tests as well as run FPGA and Flash programming. Request a free brochure from Kane Computing....

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