Product category: Analogue and Mixed Signal ICs
News Release from: Intersil | Subject: ISL55141/2/3 family
Edited by the Electronicstalk Editorial Team on 29 September 2006
Comparators speed ATE setups
Window comparators enable semiconductor device testing with ATE in large voltage swing applications without the need for bus isolation relays, saving setup time and cost.
Intersil's ISL55141/2/3 family of window comparators enables semiconductor device testing with ATE (automatic test equipment) in large voltage swing applications without the need for bus isolation relays, saving setup time and cost Users can leave the devices connected to the bus while they are not being used, even when the bus is generating wide signal voltage levels from other test cards
This article was originally published on Electronicstalk on 8 Jan 2001 at 8.00am (UK)
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