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Product category: Design and Development Hardware
News Release from: Green Hills Software | Subject: Slingshot probe
Edited by the Electronicstalk Editorial Team on 19 September 2002

USB hardware debug probe
aids 32 and 64bit design

Note: A free brochure or catalogue is available from Green Hills Software on the products in this news release. Click here to request a copy.

A new low-cost plug-and-play USB hardware debug probe helps simplify the debugging of sophisticated embedded programs by providing program download and run control without the need for a ROM monitor

A new low-cost, high-performance, plug-and-play USB hardware debug probe combines with the Green Hills Multi 2000 source-level debugger and integrated development environment (IDE) to simplify the debugging of sophisticated embedded programs by providing program download and run control without the need for a ROM monitor.

The new Slingshot probe will support most major 32 and 64bit embedded CPU and DSP architectures, including PowerPC, ARM, MIPS and ColdFire.

Slingshot gives Multi users access to and control over target processors so they can upload data from the target processor, run, halt, and reset the processor, read from and write to processor registers and memory, single-step through code, and set breakpoints.

The probe is available for Windows 98/Me/XP/2000 and connects to the host computer via a USB port.

Connection to the target processor is via industry-standard debug ports such as JTAG, EJTAG, COP, and BDM.

Slingshot is equipped with an embedded 32bit processor that enables it to achieve host/target download speeds of 10-100Kbyte/s, which is up to twice as fast as competitive probes.

Tight integration with the Multi debugger further enhances performance for the probe by greatly reducing latency for common debug commands.

Slingshot requires no external power supply and consumes no target power, deriving its power from the host via the USB port.

The probe can be used with target systems operating at 3.3V, and can be connected to and disconnected from the target system while it is running.

Diagnostics are included in every segment down to the JTAG/BDM pin level.

The announcement of this new entry-level probe follows the successful launch last year of the Green Hills Probe for high-performance and multicore applications.

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