Click on the advert above to visit the company web site
Product category: Embedded Software and Operating Systems
News Release from: Goepel Electronic
Edited by the Electronicstalk Editorial Team on 07 November 2005
JTAG test solutions go on show
Note: A free brochure or catalogue is available from Goepel Electronic about its services. Click here to request a copy.
At this year's International Test Conference (ITC) in Austin, Texas, USA, which is being held on the 8th to 10th November, Goepel Electronic will present its JTAG/boundary scan test solutions.
At this year's International Test Conference (ITC) in Austin, Texas, USA, which is being held on the 8th to 10th November, Goepel Electronic will present its JTAG/boundary scan test solutions The company, which started shipping test systems based on its revolutionary hardware architecture Scanflex earlier this year, will use the conference to introduce the first Scanflex support for analogue JTAG/boundary scan compliant to IEEE-Std