High sensitivity microanalysis without LN2 cooling: News from Jobsite

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The new Horiba XGT-5100 micro-EDXRF system with liquid nitrogen free detector cooling builds on the past success of the XGT-5000, offering high sensitivity micro-EDXRF elemental analysis and mapping. The new liquid nitrogen free detector system of the XGT-5100 offers the same high sensitivity Horiba patented 'Xerophy' silicon detector, but without the inconvenience associated with liquid nitrogen cooling. The novel detector unit still cools to the ultra low noise temperature of 77K, and hence it assures that the ground breaking performance of the XGT microscope is now available with the maximum of operator convenience.

Key features of the XGT-5100 are non-destructive microscopic elemental analysis and mapping under atmospheric pressure.

With a detectable range from Sodium (Na) to Uranium (U), the XGT-5100 can analyse a wide range of samples, including those containing water, in a non-contact manner and without sample damage.

Applications include forensic science, geology, materials, pharmaceutical, micro-electronics, biology and medicine.

With Horiba's highly efficient and ultra-narrow X-ray Guide Tube (XGT), 10 microns spatial resolution is achieved, allowing high resolution elemental mapping at speeds up to 50 times faster than other XRF instruments in the market place.

Simultaneous acquisition of both EDXRF and transmission X-ray images gives a complete picture on sample structure and composition.

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