More options for optical power meters: News from Exfo Electro-Optical Engineering

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Three new models have been added to the IQS-1700 power meter series for optical system and component manufacturing applications. The IQS-1700 power meter series, a suite of next-generation, high-performance optical power meters housed inside the IQS-500 intelligent test system, is now available with different detector sizes and types, standard- and low-polarisation sensitivity options, as well as ultra-high-power configurations - with one, two or four independent detectors per module. The IQS-1700 offers high-speed autoranging, multichannel testing, low polarisation dependence, and ease of integration with other test modules.

Key specifications include full autoranging at a sampling rate of 5kHz, up to +40dBm power handling, 0.0001dB power measurement resolution, and +/-0.005dB polarisation dependence.

"An optical power meter represents the single-most critical building block for physical-layer testing", said tienne Gagnon, Director of Product Management at EXFO.

"This is why we are constantly enhancing our full suite of power meters to provide system and component manufacturers with the most comprehensive and highest-performance solution on the market".

"These latest additions to our unique IQS optical test platform are a demonstration of our relentless commitment to expand our best-in-class offering to manufacturers, allowing full technology re-use from R and D and product qualification to high-volume manufacturing, while accelerating time-to-market which is so key in today's market".

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News Release from: Exfo Electro-Optical Engineering Edited by the Electronicstalk Editorial Team on 27 March 2003

More options for optical power meters

Three new models have been added to the IQS-1700 power meter series for optical system and component manufacturing applications.

Note: Readers of the Editor’s free email newsletter will have read this news when it was announced. . It’s free!

News Release from: Exfo Electro-Optical Engineering
Edited by the Electronicstalk Editorial Team on 27 March 2003