Product category: Design and Development Hardware
News Release from: Direct Insight
Edited by the Electronicstalk Editorial Team on 4 June 2007
Combined test technologies explained
Summer seminars around the UK will explain novel technology that combines functional and boundary scan testing
Breakthrough technology which combines functional and boundary scan testing will be explained at a series of summer seminars to be hosted by Corelis alongside UK partner Direct Insight. Featuring new products designed to integrate functional test with JTAG test, using the same test hardware, the same GUI, users will learn how the JTAG emulation/debug feature of modern CPUs can be harnessed to implement processor-specific test suites via JTAG.
This article was originally published on Electronicstalk on 4 June 2007 at 8.00am (UK)
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The new technology called JET - JTAG Emulation functional Test - is explained and demonstrated in the one-day in-depth technical seminars, which also cover the latest advances in boundary scan testing and in-system programming.
The seminars will provide practical tips and strategies to lower the cost of design, test and support for users.
ScanExpress JET takes advantage of the fact that most of the 32 and 64bit processors have a built-in JTAG emulation debug port.
The software uses the JTAG debug port to control the CPU and perform functional tests.
The new tool-suite combines common pin and net level diagnostics using boundary-scan testing with CPU emulation testing through its JTAG port.
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This provides functional test capabilities on designs utilising JTAG compatible CPUs to even nonJTAG peripheral components including analogue parts connected within the CPU address and I/O space.
This means that sound structural tests for opens and shorts can be performed via boundary-scan while at-speed functional testing can be performed using the CPU to run test programs loaded into memory.
Before loading test programs into onboard memory, ScanExpress JET is using a proprietary technique to test the onboard memory at speed without loading any code into this memory.
This means that ScanExpress JET can test and diagnose faulty boards and systems even when the embedded CPU is not able to boot and the board self test is not operational.
Users can access prebuilt functional tests or create functional test scripts from scratch to test nonstandard parts.
Furthermore, because ScanExpress JET seamlessly integrates with existing Corelis hardware, current ScanExpressTPG and ScanExpress Runner customers can add on this functionality without having to purchase an additional JTAG controller to access the embedded CPU.
Corelis multi-TAP controllers can provide emulation and debug capability on one TAP while connecting the rest of the boundary-scan chain on separate TAPs.
No other test tool currently allows this configuration.
Performing all of the testing from a single JTAG controller not only reduces cost, but also simplifies the hardware required for testing and the connection to the product under test.
Seminars will be held in travel-friendly UK locations near Bracknell, Cambridge and Birmingham, on 10th, 11th and 12th July, respectively.
Bookings may be made via the Direct Insight website. Request free introductory details about products from Direct Insight....
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