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Product category: Stand-Alone Instruments
News Release from: Clare Instruments | Subject: H2 Hal Scan
Edited by the Electronicstalk Editorial Team on 06 March 2007

Scanner tests board-level components

Hi-pot flash tester and scanner verifies the functional and quality validation of a wide range of electronic components.

Clare Instruments has developed a new hi-pot flash tester and scanner for the functional and quality validation of a wide range of electronic components The microprocessor controlled H2 Hal Scan can be used to confirm the safety, integrity and performance of semiconductor devices, interconnections, wound components (including transformers), switches and similar devices used in the manufacture and assembly of electronic and electrical products