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Product category: Design and Development Software
News Release from: Cadence Design Systems | Subject: Cadence Encounter Test
Edited by the Electronicstalk Editorial Team on 14 July 2006
Diagnostics technology lead extended
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Industry-award winning Cadence encounter test expands data compression and yield diagnostic offerings to address escalating manufacturing costs and yield ramp.
Cadence Design Systems has announced it is extending its technology leadership in test and yield diagnostics with new compression and yield diagnostics capabilities The new release of Cadence Encounter Test addresses the escalating cost of manufacturing high quality silicon with expanded support for non-proprietary, on-chip exclusive-or (XOR) test data compression structures
This article was originally published on Electronicstalk on 9 Mar 2005 at 8.00am (UK)