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Product category: Design and Development Software
News Release from: Cadence Design Systems | Subject: True-Time
Edited by the Electronicstalk Editorial Team on 21 May 2004
Timing delay tester tackles nanometre
designs
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Cadence Design Systems reckons it has brought timing to the manufacturing floor with True-Time delay test for processes at 130nm and below.
Cadence Design Systems reckons it has brought timing to the manufacturing floor with True-Time delay test for processes at 130nm and below This addition to Cadence Encounter Test helps ensure the highest quality-of-silicon (QoS) by detecting subtle IC defects
This article was originally published on Electronicstalk on 29 Nov 2005 at 8.00am (UK)
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