News Release from: Ardent Concepts
Edited by the Electronicstalk Editorial Team on 22 March 2004
Novel contact simplifies PGA test fixtures
A new range of high-performance PGA test fixture solutions is based on innovative proprietary interconnect technology - the Redundant Contact.
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A new range of high-performance PGA test fixture solutions is based on innovative proprietary interconnect technology - the Redundant Contact. "An early commitment to developing world class contactor and test fixture solutions with Redundant Contact technology has elicited some unique challenges from our customers", says Ardent Concepts Vice President for Business Development Steve Cleveland. "Our focus into high-density arrays led this particular customer to request a nearly 1000 I/O array with stringent tolerances.
The results prove once again that Redundant Contact technology is a highly robust, extremely consistent compliant solution.
We are pleased to add this family of contactors to our product line".
The all-metal Redundant Contact technology offers electrical invisibility with a measured self inductance of 0.5nH and a -1dB insertion loss at 24GHz and a -3dB bandwidth over 30GHz in 0.5mm pitch configuration.
The Redundant Contact achieves low contact resistance by using a low surface area contact patch.
This allows engineers to design high-node-count interconnections without high levels of contact force.
The Redundant Contact is able to accommodate a wide variety of applications in area array and peripherally leaded interconnect designs.
The Redundant Contact can achieve pitches of 0.25mm, and is capable of Kelvin contacting on 0.5mm pitch devices.
The contact technology is ideal for RF testing of various package types including QFN packages, PCB to PCB as well as all other chip scale, flip chip, substrate and other packaged IC interconnections.
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