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Product category: Design and Development Software
News Release from: Ansoft Europe | Subject: Ansoft Designer
Edited by the Electronicstalk Editorial Team on 16 June 2003

Test software link aids RF design

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A new API integrates Ansoft Designer with NI LabView, allowing design engineers to incorporate real-world measurements into their RF and wireless system design flow

Through a new API that integrates Ansoft Designer and NI LabView, design engineers can easily incorporate real-world measurements into their RF and wireless system design flow to accelerate the model development and system validation of today's complex RF and mixed-signal systems. A set of example programs for integrating LabView and Ansoft Designer, is available for download at from the National Instruments website.

"By working with NI, we can provide our customers with a more efficient method of validating wireless, wire-line and optical-communications application designs.

We are extending traditional RF system design simulation by combining the Ansoft Designer automated design environment with the advanced measurement capabilities of LabView", said Nicholas Csendes, Ansoft President and CEO.

"This provides a solution that covers the complete design flow, from concept and system design to individual component and system testing".

Engineers use the Ansoft family of circuit, system and electromagnetic modeling and advanced simulation products to create and simulate RF and microwave system designs.

Now, with the new LabView data exchange tools for interfacing with standard Touchstone RF data files, LabView and Ansoft Designer can easily share data.

Through LabView, design engineers have access to a wide variety of measurement I/O - from vector network analysers to modular RF instruments, such as the new NI PXI-5660 RF signal analyser - so they can generate real-world stimuli and take real-world measurements.

Engineers then can compare measured results with simulation data to identify design flaws earlier, greatly improving time-to-market and quality of communications technologies used in cellphones, cable modems, PDAs and other wireless devices.

"Our work with Ansoft brings the full benefits of virtual instrumentation to RF system design", said Mihir Ravel, NI Vice President of Technology and Corporate Development.

"By integrating LabView with Ansoft Designer, engineers can take advantage of powerful math and digital signal processing tools for signal analysis and connect to the broadest array of instruments".

The companies will demonstrate their integrated solutions at the Microwave Theory and Techniques 2003 show in Philadelphia, at both the Ansoft booth (#1429) and the NI booth (#2602).

The new LabView data exchange tools for integrating with Ansoft Designer work with both LabView 7 Express and LabView 6.1.

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