Product category: Intellectual Property Cores
News Release from: ARM | Subject: EmBISTRx
Edited by the Electronicstalk Editorial Team on 25 October 2006
Memory compilers integrate test and
repair
Embedded memory test and repair system is tightly integrated with the ARM Advantage and Metro memory compilers.
ARM has announced the availability of its new advanced emBISTRx embedded memory test and repair system that is tightly integrated with the ARM Advantage and Metro memory compilers, part of its family of Artisan physical IP The ARM fully embedded memory subsystem with integrated built-in-self-test (BIST) and built-in-self repair (BISR) IP increases overall chip yield to reduce chip cost, raise profit margins and enhance manufacturing test quality for Advantage and Metro memories for 45, 65 and 90nm processes
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)
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