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Product category: Test Accessories
News Release from: Aries Electronics | Subject: 13mm square centre probe test socket
Edited by the Electronicstalk Editorial Team on 11 February 2008
Test socket promises minimal signal loss
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Socket is ideal for manual high-speed testing of devices such as CSP, micro-BGA, DSP, LGA, SRAM, DRAM and Flash, with pitches as low as 0.40mm.
Aries Electronics has developed a new high-frequency centre probe test socket for devices up to 13mm square Available in four versions with ratings of 1-3, 3-5, 5-9 and 10-18GHz, the new socket is ideal for manual high-speed testing of devices such as CSP, micro-BGA, DSP, LGA, SRAM, DRAM and Flash, with pitches as low as 0.40mm