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Product category: Test Accessories
News Release from: Aries Electronics | Subject: RF test sockets
Edited by the Electronicstalk Editorial Team on 11 July 2006
Test sockets handle complex RF devices
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A new high frequency test socket for devices from 41 to 55mm2 is ideal for manual testing of devices with pitches down to 0.40mm, in applications with speeds from 1GHz to more than 18GHz.
Aries Electronics has introduced a new high frequency test socket for devices from 41 to 55mm2 The new socket is ideal for manual testing of devices with pitches down to 0.40mm, in applications with speeds from 1GHz to more than 18GHz, such as CSP, MicroBGA, DSP, LGA, SRAM, DRAM and Flash devices