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Product category: Test Accessories
News Release from: Agilent Technologies Europe | Subject: DDR BGA probe
Edited by the Electronicstalk Editorial Team on 29 January 2008
Probe meets demands of faster DRAM
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Agilent's new DDR BGA probe provides direct access to the balls of the DRAM with low loading and minimal impact to signal integrity.
Agilent Technologies has released the industry's first DDR2 and DDR3 ball-grid array (BGA) probes for oscilloscopes and logic analysers Dynamic random access memory (DRAM) data rates have increased significantly over the past few years
This article was originally published on Electronicstalk