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Product category: Stand-Alone Instruments
News Release from: Agilent Technologies Europe | Subject: VTEP v2.0 tests and Network Parameter Measurement
Edited by the Electronicstalk Editorial Team on 23 February 2007
Test suite finds opens on power and
ground pins
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The VTEP 2.0 suite of vectorless test techniques includes the new Network Parameter Measurement technology which allows users to detect opens on power and ground pins on connectors.
Agilent's Medalist VTEP v2.0 is a suite of vectorless test techniques that includes the new Network Parameter Measurement technology which allows users to detect opens on power and ground pins on connectors This is something that many industry players had conceded as beyond existing test capabilities