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    <title>Board-level instruments latest news on Electronicstalk</title>
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    <description>Board-level instruments latest news on Electronicstalk</description>
    <language>en-gb</language>
    <copyright>Copyright (C)2010 Pro-Talk Ltd. All rights reserved.</copyright>
    <pubDate>Mon, 27 Dec 2010 08:00:00 UT</pubDate>
    <lastBuildDate>Mon, 27 Dec 2010 08:00:00 UT</lastBuildDate>
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      <title>NI DAQ system measures up to 256 signals</title>
      <description>National Instruments (NI) has released an Ethernet-based CompactDAQ modular data-acquisition system for measuring up to 256 channels of electrical, physical, mechanical or acoustic signals.</description>
      <pubDate>Thu, 05 Aug 2010 08:00:00 UT</pubDate>
      <category>National Instruments</category>
      <link>http://www.electronicstalk.com/news/naa/naa491.html</link>
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    <item>
      <title>Peak Test Services introduces short-travel probe</title>
      <description>The P909 Series from Peak Test Services is a short-travel probe for battery contact applications.</description>
      <pubDate>Tue, 27 Jul 2010 08:00:00 UT</pubDate>
      <category>Peak Test Services</category>
      <link>http://www.electronicstalk.com/news/pak/pak163.html</link>
    </item>
    <item>
      <title>Waveform generators for electronic device testing</title>
      <description>Tabor Electronics has released its Wavexciter series of high-speed arbitrary waveform generators for electronic test applications.</description>
      <pubDate>Fri, 04 Jun 2010 08:00:00 UT</pubDate>
      <category>Tabor Electronics</category>
      <link>http://www.electronicstalk.com/news/tae/tae115.html</link>
    </item>
    <item>
      <title>Signal generators for digital datacom applications</title>
      <description>Anritsu has introduced the MG3690C series of RF/microwave signal generators for testing microwave components, subsystems as well as verifying radar and communications systems.</description>
      <pubDate>Thu, 27 May 2010 08:00:00 UT</pubDate>
      <category>Anritsu</category>
      <link>http://www.electronicstalk.com/news/anr/anr257.html</link>
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      <title>Mod5 Flip-Top Socket for 0.5mm-pitch BGA devices</title>
      <description>The Mod5 Flip-Top BGA Socket provides a compact, surface-mount test solution for micro-BGA chipsets used in applications such as handheld, mobile and wireless product development.</description>
      <pubDate>Mon, 24 May 2010 08:00:00 UT</pubDate>
      <category>Advanced Interconnections</category>
      <link>http://www.electronicstalk.com/news/adi/adi123.html</link>
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    <item>
      <title>Clare provides wiring analyser for Hipot testing</title>
      <description>Clare Instruments is offering the Horizon II, said to provide rapid and easy Hipot testing of cables, connectors and harnesses up to 1,500 DC/1067V AC.</description>
      <pubDate>Tue, 27 Apr 2010 08:00:00 UT</pubDate>
      <category>Clare Instruments</category>
      <link>http://www.electronicstalk.com/news/cku/cku146.html</link>
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    <item>
      <title>Spectrum launches M3i.21xx digitiser series</title>
      <description>Spectrum has introduced the M3i.21xx series digitiser, which is based on the M3i platform.</description>
      <pubDate>Mon, 29 Mar 2010 08:00:00 UT</pubDate>
      <category>Spectrum Systementwicklung Microelectronic</category>
      <link>http://www.electronicstalk.com/news/sct/sct127.html</link>
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    <item>
      <title>Teseq releases PMM 9010/30P EMI receiver/analyser</title>
      <description>Teseq is offering a digital EMI receiver/analyser with optimum measurement parameters for EMC labs that do not require full CISPR compliance for radiated emissions measurements.</description>
      <pubDate>Thu, 25 Mar 2010 08:00:00 UT</pubDate>
      <category>Teseq</category>
      <link>http://www.electronicstalk.com/news/tvo/tvo121.html</link>
    </item>
    <item>
      <title>Signal generator recreates tough RF environments</title>
      <description>RF Engines (RFEL) has developed a 32-channel radio-frequency (RF) signal generator that is designed to enable challenging RF environments to be recreated in laboratories to test RF equipment.</description>
      <pubDate>Wed, 03 Feb 2010 08:00:00 UT</pubDate>
      <category>RF Engines</category>
      <link>http://www.electronicstalk.com/news/rfe/rfe141.html</link>
    </item>
    <item>
      <title>AE develops precision amplifier for EMC testing</title>
      <description>AE Techron has developed the 7224 precision amplifier for the EMC compliance testing market.</description>
      <pubDate>Thu, 28 Jan 2010 08:00:00 UT</pubDate>
      <category>AE Techron</category>
      <link>http://www.electronicstalk.com/news/aet/aet100.html</link>
    </item>
    <item>
      <title>Goepel introduces controller at Productronica</title>
      <description>Goepel Electronic has introduced the SFX/ASL1149-(x) controller, part of the Scanflex JTAG/Boundary Scan hardware platform, at the Productronica trade fair.</description>
      <pubDate>Thu, 10 Dec 2009 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe190.html</link>
    </item>
    <item>
      <title>NI products expand PXI semiconductor test options</title>
      <description>National Instruments has introduced 10 PXI products that expand the capabilities of PXI for mixed-signal semiconductor test.</description>
      <pubDate>Fri, 27 Nov 2009 08:00:00 UT</pubDate>
      <category>National Instruments</category>
      <link>http://www.electronicstalk.com/news/naa/naa473.html</link>
    </item>
    <item>
      <title>Pickering releases 41-752 battery simulator</title>
      <description>Pickering Interfaces' 41-752 is a six-cell battery simulator that provides up to 300mA of current from each cell.</description>
      <pubDate>Mon, 09 Nov 2009 08:00:00 UT</pubDate>
      <category>Pickering Interfaces</category>
      <link>http://www.electronicstalk.com/news/pck/pck151.html</link>
    </item>
    <item>
      <title>Hamamatsu to exhibit CCD board-level cameras</title>
      <description>Hamamatsu will be introducing the C10990 series of OEM CCD board-level cameras at the Photonex 2009 Exhibition.</description>
      <pubDate>Fri, 02 Oct 2009 08:00:00 UT</pubDate>
      <category>Hamamatsu Photonics UK</category>
      <link>http://www.electronicstalk.com/news/has/has112.html</link>
    </item>
    <item>
      <title>PXI module supports JTAG/Boundary Scan Test</title>
      <description>At the Defence Systems and Equipment International (DSEI) event, Goepel Electronic launched its PXI 5396/FXT-x, a further series of JTAG/Boundary Scan digital I/O modules on the basis of the PXI bus.</description>
      <pubDate>Wed, 30 Sep 2009 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe189.html</link>
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